Reliability of Capacitors and Magnetic Components in Power Electronic Applications
Conference: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
03/24/2020 - 03/26/2020 at Berlin, Deutschland
Proceedings: ETG-Fb. 161: CIPS 2020
Pages: 6Language: englishTyp: PDF
Authors:
Wang, Huai; Wang, Haoran; Shen, Zhan (Aalborg University, Aalborg, Denmark)
Abstract:
This paper presents the wear out related reliability studies of capacitors and magnetic components used for power electronic converters. Accelerated lifetime testing, failure mechanisms, lifetime prediction and reliability design are presented based on the state-of-the-arts.