Implementation and validation of a dynamic calorimetric method to evaluate the losses in switching discrete power MOSFETs
Conference: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
03/24/2020 - 03/26/2020 at Berlin, Deutschland
Proceedings: ETG-Fb. 161: CIPS 2020
Pages: 6Language: englishTyp: PDF
Authors:
Tran, Do Phuong Uyen; Avenas, Yvan (Universite Grenoble Alpes, CNRS, Grenoble INP, G2Elab, 38000 Grenoble, France)
Lefebvre, Stephane (SATIE, ENS Paris Saclay, Cnam, CNRS, 94230 Cachan, France)
Abstract:
The design of static converters is based on various factors, including the losses in power semiconductor components and the working temperature of these components. This paper presents a dynamic calorimetric method whose objective is to estimate losses in semiconductor components with consideration of their evolution as a function of junction temperature. In order to evaluate the accuracy of this method, experimental tests are carried out with power MOSFET components used in a switching cell. A method for separating conduction and switching losses is also proposed.