IEC 61967-6:2002/AMD1:2008

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

Circulation Date: 2008-03
Edition: 1.0
Language: EN-FR - bilingual english/french
Seitenzahl: 40 VDE Artno.: 214415